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Automatic Inspection

Study for the Textile Industry

Contents:

The study is divided into two sections. The first section was written exclusively

by the three co-authors in complete independence of the inspection system

manufacturers. Particular emphasis was placed on providing a strictly objective

account of the scientific and technical facts.

Upon reading the study, the reader should be able to evaluate information and

materials about inspection systems independently, as well as to assess his own

opportunities and requirements accurately.

At the same time, in order to provide the reader with the opportunity to become

acquainted with the entire range of automatic inspection systems on the market

today, articles written by the inspection system manufacturers have been

incorporated into the second section; the authors of the study had no editorial

influence whatsoever on the contents of these articles.

  • Preface
  • Description of the problem
  • Division of the problem based on a product-production process scheme
  • Division of the products
  • Production process; possible inspection sites
  • Basic conditions of production
  • Integration into the production process
  • Economic feasibility
  • Current Situation
  • Inspection systems today
  • Example: laser scanners
  • Developmental Trends
  • Sensor types
  • Evaluation technology
  • Adaptability
  • Operation
  • Quality assurance concepts
  • Quality documentation
  • Defect Classification from the Practitioner's Point of View
  • Local and global defects
  • Surface defects on woven, knit, and nonwoven goods
  • (warp, weft, local, weave, texture, pattern...)
  • Coating defects
  • Color defects
  • Equipment defects
  • Printing defects
  • Technical Explanations
  • Measurement of local parameters
  • Laser scanners
  • Light scanners
  • CCD line cameras
  • Multi-channel scanners
  • Measurement of global parameters
  • Electromagnetic spectrum
  • Color spaces, color measurement
  • Measurement of gloss/haze
  • Roughness, feel
  • Moisture content measurement
  • Temperature measurement

Technical Terminology

laser, scanner, telecentricity, bright-field, dark-field, reflection, transmission,

absorption, fluorescence, light sources, LEDs, metal steam lamps, CCD, line, array,

PMT, Si diode, avalanche diode, local resolution, scanning theorem, data quantity,

binarization, AD converter, vision system, quality assurance concept, fuzzy

procedure, neuronal network, moire, fraktale, chaos, classification (human, machine),

K(A)I, expert knowledge, knowledge engineer, morphology, etc.

Target Market

This study has been developed especially for those individuals who are responsible

for production, finishing or quality assurance, or for those individuals who are

involved in the decision-making process in such areas.



Publishers, Length and Price of the Study

The study is being published independently by the three co-authors Bertram

Nickolay, Karl-Heinz Schicktanz and Harald Schmalfuß.

The length of the study is approximately 300 pages, DIN A4 format, glue-bound.

The study is bilingual German/English

Price: Special prepaid EMAIL price (incl. tax+shipping): 250.00 DM or 175.00 US-$



About the Authors

Dr.-Ing. Bertram Nickolay, born in 1953, studied telecommunications at the

University for Applied Science of Saarland, and electrical engineering at the

Technical University of Berlin. Since 1981, he has been a staff member of the

Fraunhofer Institute for Production Systems and Construction Technology (IPK

Berlin).

Dr. Nickolay received his doctorate of engineering degree in 1990 from the

Technical University of Berlin in the field of construction design and

manufacturing. His dissertation was entitled "A supervised learning image

evaluation system for the detection of surface defects."

Since 1991 Dr. Nickolay has headed the department of pattern recognition at the

IPK. In recognition of his work in the area of applied research, he was awarded

the Joseph von Fraunhofer Prize in 1992.

Dip.-Ing. (FH) Karl-Heinz Schicktanz, born in 1926, completed his studies in textile

technology. He then worked for over two decades as production manager for

several well-known equipment supply companies and weaving mills.

Mr. Schicktanz spent the subsequent ten years with Erwin Sick GmbH, Munich

division, a company devoted to surface inspection technology. He was instrumental

in promoting and gaining acceptance for automatic surface inspection. His

numerous publications have dealt, and continue to deal, with this topic.

He is currently working as an independent consultant for the textile industry.

Dr. Harald Schmalfuß, born in 1949, studied physics at the Friedrich Alexander

University in Erlangen. He completed his diploma and doctoral dissertations in the

Department of Applied Optics.

From 1979 to 1986 Dr. Schmalfuss worked at the Battelle Institute in Frankfurt am

Main, eventually becoming manager of the control systems department. His work

focused primarily on the area of automatic industrial opto-electronic in-line

measurement technology.

From 1986 to 1990 he was the manager first of research and development, and then

of electronic systems, at Erwin Sick GmbH, Munich division, a company specializing

in surface inspection technology.

In 1990 he accepted a position as technical manager with Durag GmbH in Hamburg.

In 1992 Dr. Schmalfuß founded his own company in Geretsried, Germany, opdix

OptoElectronic GmbH, Consultation-Development-Sales, of which he is managing

director.



Important Notice

This study and any portion thereof are authorized only for the internal use of

purchasers of the study. Using the study for any other purpose, or passing it on

to third parties, is strictly forbidden. Neither the study, nor any portion thereof,

may be reproduced in any manner whatsoever, including digital data reproduction,

without express written permission from the authors. The company articles are

excepted from these restrictions; they may be reproduced at will.




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Copyright: opdix OptoElectronic GmbH 2001

, Letzte Änderung: 10.06.99 13:41